Surface Passivation of Crystalline Silicon using Amorphous Silicon: An Evaluatio

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The Suns light rays continuously strike the Earth's surface and could provide ten times the amount of electricity society consumes. This represents an untapped natural resource that is only now being harvested. Photovoltaics (solar cell) is the field that strives to develop this energy resource. Typical polysilicon (multi-crystalline) solar modules have efficiencies around 14%. To improve efficiencies and reduce costs the exploration of new structures has been undertaken. High efficiency photovoltaic devices can be produced using a novel all silicon heterostructure. This book attempts to explore the passivation of the crystalline silicon (c-Si) surface with hydrogenated amorphous silicon films (a-Si:H). The critical parameter in determining the quality of passivation is the effective minority carrier lifetime of the c-Si/a-Si:H heterostructure. These lifetime measurements were performed with the novel, all optical, Photocarrier Radiometry (PCR) technique. This book is intended for those who are pursuing technological applications in c-Si/a-Si:H heterostructures, as well as to those in the PV field in dealing with surface passivation and lifetime measurements.

FORMATPaperback LANGUAGEEnglish CONDITIONBrand New Publisher Description

The Suns light rays continuously strike the Earth's surface and could provide ten times the amount of electricity society consumes. This represents an untapped natural resource that is only now being harvested. Photovoltaics (solar cell) is the field that strives to develop this energy resource. Typical polysilicon (multi-crystalline) solar mo-dules have efficiencies around 14%. To improve efficiencies and reduce costs the exploration of new structures has been undertaken. High efficiency photovoltaic devices can be produced using a novel all silicon heterostructure. This book attempts to explore the passivation of the crystalline silicon (c-Si) surface with hydrogenated amorphous silicon films (a-Si: H). The critical parameter in determining the quality of passivation is the effective minority carrier lifetime of the c-Si/a-Si: H heterostructure. These lifetime measurements were performed with the novel, all optical, Photocarrier Radiometry (PCR) technique. This book is intended for those who are pursuing technological applications in c-Si/a-Si: H heterostructures, as well as to those in the PV field in dealing with surface passivation and lifetime measure-ments.

Author Biography

Keith R. Leong, PhD candidate in Electrical Engineering at the University of Toronto. MASc (UofT - Electrical Engineering (Photonics Group)), BASc (UofT - Engineering Science Physics Option). IEEE student member (10 years).

Details ISBN3639023536 Author Keith Leong Short Title SURFACE PASSIVATION OF CRYSTAL Pages 88 Language English ISBN-10 3639023536 ISBN-13 9783639023534 Media Book Format Paperback Year 2008 Subtitle An Evaluation by PhotoCarrier Radiometry (PCR) UK Release Date 2008-06-13 Imprint VDM Verlag Dr. Mueller E.K. Country of Publication Germany Illustrations black & white illustrations Publisher VDM Verlag Dr. Mueller E.K. Publication Date 2008-06-13 Audience General We've got this

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